NANOCON 2026 - Program konference

Nanocharacterization / Metrology

11:00 - 11:30

E1

YACOOT Andrew

National Physical Laboratory, , United Kingdom

The Use of the Lattice Parameter of Silicon for Dimensional Nanometrology and Bringing Metrology to High-Speed Atomic Force Microscopy - VYŽÁDANÁ PŘEDNÁŠKA

11:30 - 11:45

E2

MAJCHRZYCKI Łukasz

Poznan University of Technology, Poznan, Poland, EU

Atomic Force Microscopy Investigation of Structure–property Relationships in Thermally Reduced Single-Layer Graphene Oxide

11:45 - 12:00

E3

SOCACIU-SIEBERT Liana

SPECS Surface Nano Analysis GmbH, Berlin, Germany, EU

EnviroMETROS: The Future of Surface Hybrid Metrology - KOMERČNÍ PREZENTACE

12:00 - 12:15

E4

FEDOR Adam

Institute of Physics of Materials of the CAS, Brno, Czech Republic, EU

An Al-N-Si Interatomic Potential for Molecular Dynamics Simulations of Nanodevices

12:15 - 12:30

E5

MANI Balamurugan

VSB - Technical University of Ostrava, Ostrava, Czech Republic, EU

Electronic Structure Modulation of Single-Atomic Sites for Efficient and Selective Semihydrogenation of Alkynes

12:30 - 12:45

E6

ÖZTEMUR SEZGIN Janset

Istanbul Technical University, Istanbul, Turkey

Fabrication and Characterization of Heparin-Loaded PCL/PVA Bicomponent Fibrous Surfaces for Small Diameter Vascular Grafts

Nanocharacterization / Technics

09:00 - 09:30

E7

ČÍŽEK Jakub

Charles University, Prague, Czech Republic, EU

Positron Annihilation Spectroscopy - VYŽÁDANÁ PŘEDNÁŠKA

09:30 - 09:45

E8

PTAK Arkadiusz

Poznan University of Technology, Poznań, Poland, EU

Mechanisms Governing Nanoscale Dry Friction

09:45 - 10:00

E9

BAALOUDJ Oussama

Palacký University Olomouc, RCPTM, CATRIN, Olomouc, Czech Republic, EU

Study of the Complex Cation Disorder and Electron Density Distribution in High-Entropy Spinel Oxides Using Combined Rietveld Refinement and Maximum Entropy Method Analysis

10:00 - 10:15

E10

ŠEC Karel

Nicolet CZ, Prague, Czech Republic, EU

Multidimensional Vibrational Spectroscopy: integration of µ-IR, nano-IR, Raman and AFM for multi-scale surface characterization - KOMERČNÍ PREZENTACE

10:15 - 10:30

E11

YADAV Ankit

Institute of Physics of Materials of the CAS, Brno, Czech Republic, EU

A New Method to Construct Realistic Nanocrystalline Grain Boundaries: Cylindrical Sintering vs. Voronoi Tessellation in Atomistic Aluminum Simulations

10:30 - 11:00

COFFEE BREAK

Nanocharacterization / Technics

11:00 - 11:30

E12

REMEŠ Zdeněk

Institute of Physics of the CAS, Prague, Czech Republic, EU

Photoluminescence and Photocurrent Spectra of Co-doped ZnO Thin Films Prepared by Pulsed Laser Deposition

11:30 - 11:45

E13

OROLÍN Jakub

Measurement Technic Moravia Ltd., Zastávka, Czech Republic, EU